IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society

This paper analyzes how a previously presentedadaptive open loop gate driver handles fault currents. Whencontrolling insulated gate bipolar transistors (IGBTs), it isessential to ensure safe operation in the whole operating range.Most important, the gate driver must be able to safely turn OFFa unacceptably high current like a short-circuit current. Such afault generates a current of unknown magnitude, which has tobe switched off as safe and slow as possible. A special shutdownmode of the investigated open loop gate driver is presented in thispaper, which makes it possible to safely shut down a fault currentwithout knowing the actual operating point of the IGBT. Basedon measurement results it is shown that all currents, includingdesaturation of the IGBT can be safely turned OFF.

Dissertation an der Fakultät für Elektrotechnik und Informationstechnik (ETIT) des Karlsruher Instituts für Technologie (KIT)

KITopen-ID: 1000131089

DOI: 10.5445/IR/1000131089

PCIM Europe digital days : : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 3-7 May 2021

This paper presents a fast overcurrent and short circuit protection based on the mirror source detection method for 1200V/1200A Silicon Carbide (SiC) MOSFETs used in a high power Dual Active Bridge (DAB). It will be shown that this protection method is feasible for a low inductive short circuit caused by a half bridge shoot through, a high inductive short circuit based on a failure inside the load as well as short circuits of Type 1 or hard switching fault. Additionally, the short circuit behaviour is analyzed for different junction temperatures of the MOSFETs. Experimental results proof that using the investigated method always ensures the operation in the Short Circuit Safe operating Area (SCSOA) of the MOSFET after triggering short circuits.

PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

"This paper presents a multi-dimensional full automatic semiconductor test bench for accurate semiconductor
loss determination. The test bench is based on the double pulse test and allows the measurement
of conduction losses and switching energies for any current, voltage and temperature combination of the
device under test. A conduction- and switching loss analysis is presented for silicon carbide (SiC)- and
silicon (Si)-based semiconductor devices. Distinct differences of datasheet information and measurement
results demonstrate the significant benefits of the designed test bench for an accurate semiconductor loss
calculation. Afterwards the semiconductor loss calculation results based on the data sheet data and the
measured losses are compared."

Fabian Dudnitzek

Kai Hildenbrand

Felix Kappeler

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Sven Zwick